|
Volumn 4, Issue 3, 2001, Pages 34-38
|
Integrated silicon microspectrometers
|
Author keywords
[No Author keywords available]
|
Indexed keywords
DIFFRACTION GRATINGS;
ETCHING;
FABRY-PEROT INTERFEROMETERS;
INFRARED DETECTORS;
INSPECTION;
MICROELECTROMECHANICAL DEVICES;
MICROELECTRONICS;
MICROMACHINING;
QUALITY CONTROL;
SPECTROMETERS;
ELECTROCHEMICALLY CONTROLLED ETCHING;
INFRARED ABSORPTION;
SILICON MICROSPECTROMETERS;
SILICON SENSORS;
|
EID: 0035450419
PISSN: 10946969
EISSN: None
Source Type: Journal
DOI: 10.1109/5289.953457 Document Type: Article |
Times cited : (27)
|
References (13)
|