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Volumn 4, Issue 3, 2001, Pages 34-38

Integrated silicon microspectrometers

Author keywords

[No Author keywords available]

Indexed keywords

DIFFRACTION GRATINGS; ETCHING; FABRY-PEROT INTERFEROMETERS; INFRARED DETECTORS; INSPECTION; MICROELECTROMECHANICAL DEVICES; MICROELECTRONICS; MICROMACHINING; QUALITY CONTROL; SPECTROMETERS;

EID: 0035450419     PISSN: 10946969     EISSN: None     Source Type: Journal    
DOI: 10.1109/5289.953457     Document Type: Article
Times cited : (27)

References (13)
  • 11
    • 0029276691 scopus 로고
    • Silicon micromachined infrared sensor with tunable wavelength selectivity for application in infrared spectroscopy
    • (1995) Sens. Actuators A, Phys. , vol.46-47 , pp. 413-416
    • Rossberg, D.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.