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Volumn 45, Issue 9, 2001, Pages 1549-1557
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Analytical approximation of effective surface recombination velocity of dielectric-passivated p-type silicon
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Author keywords
[No Author keywords available]
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Indexed keywords
APPROXIMATION THEORY;
ELECTRONIC DENSITY OF STATES;
PASSIVATION;
PERMITTIVITY;
PLASMA ENHANCED CHEMICAL VAPOR DEPOSITION;
SEMICONDUCTOR DOPING;
SILICON NITRIDE;
SURFACE PASSIVATION;
SEMICONDUCTING SILICON;
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EID: 0035449469
PISSN: 00381101
EISSN: None
Source Type: Journal
DOI: 10.1016/S0038-1101(01)00169-1 Document Type: Article |
Times cited : (16)
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References (9)
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