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Volumn 45, Issue 9, 2001, Pages 1549-1557

Analytical approximation of effective surface recombination velocity of dielectric-passivated p-type silicon

Author keywords

[No Author keywords available]

Indexed keywords

APPROXIMATION THEORY; ELECTRONIC DENSITY OF STATES; PASSIVATION; PERMITTIVITY; PLASMA ENHANCED CHEMICAL VAPOR DEPOSITION; SEMICONDUCTOR DOPING; SILICON NITRIDE;

EID: 0035449469     PISSN: 00381101     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0038-1101(01)00169-1     Document Type: Article
Times cited : (16)

References (9)
  • 7
    • 36549096341 scopus 로고
    • Analysis of the interaction of a laser pulse with a silicon wafer: Determination of bulk lifetime and surface recombination velocity
    • (1987) J Appl Phys , vol.61 , pp. 2282-2293
    • Luke, K.L.1    Cheng, L.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.