Stress-optic modulator: A novel device for high sensitivity linear birefringence measurements

Measurement Science and Technology

Volumn 12, Issue 9, 2001, Pages 1503-1508

  Brandi, Fernando ^a,b,d   Polacco, Erseo ^a,b   Ruoso, Giuseppe ^c,e  

^a INFN SEZIONE DI PISA   (Italy)

^b UNIVERSITY OF PISA   (Italy)

^c UNIVERSITY OF PADOVA   (Italy)

^d VU UNIVERSITY AMSTERDAM   (Netherlands)

^e LABORATORI NAZIONALI DI LEGNARO   (Italy)

Author keywords

Birefringence; Elasto optical effects; Ellipsometers

Indexed keywords

ANISOTROPY; BIREFRINGENCE; FEEDBACK; HETERODYNING; LIGHT POLARIZATION; SENSITIVITY ANALYSIS;

STRESS-OPTIC MODULATORS (SOM);

LIGHT MODULATORS;

MEASUREMENT METHOD;

EID: 0035448019     PISSN: 09570233     EISSN: None     Source Type: Journal    
DOI: 10.1088/0957-0233/12/9/317     Document Type: Article

References (16)