Particle-induced X-ray emission using high energy ions with respect to microprobe application

Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms

Volumn 179, Issue 4, 2001, Pages 469-479

  Schmelmer, O ^a   Dollinger, G ^a   Datzmann, G ^a   Hauptner, A ^a   Korner H J ^a   Maier Komor, P ^a   Reichart, P ^a  

^a TECHNICAL UNIVERSITY OF MUNICH   (Germany)

Author keywords

Ion beam analysis; Microprobe; PIXE

Indexed keywords

HEAVY METALS; HIGH ENERGY PHYSICS; ION BEAMS; PROTON BEAMS; X RAY PRODUCTION;

PARTICLE-INDUCED X-RAY EMISSIONS (PIXE);

X RAY ANALYSIS;

EID: 0035447122     PISSN: 0168583X     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0168-583X(01)00608-5     Document Type: Article

References (34)