Growth and characterization of rare-earth monosulfides for cold cathode applications

Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures

Volumn 19, Issue 5, 2001, Pages 1958-1961

  Modukuru, Y ^a   Thachery, J ^a   Tang, H ^a   Malhotra, A ^a   Cahay, M ^a   Boolchand, P ^a  

^a 705 Engineering Research Center   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CATHODES; CHARACTERIZATION; ELECTRONS; GROWTH (MATERIALS); LATTICE CONSTANTS; NEODYMIUM COMPOUNDS; PHONONS; RAMAN SCATTERING; X RAY POWDER DIFFRACTION;

NEGATIVE ELECTRON AFFINITY (NEA);

LANTHANUM COMPOUNDS;

EID: 0035440464     PISSN: 10711023     EISSN: None     Source Type: Journal    
DOI: 10.1116/1.1406158     Document Type: Article

References (16)

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11. 2S.
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13. The LaS and NdS bulk samples were examined in a micro-Raman equipped with an optical microscope attachment with a video monitor. Examples of sample micrographs can be viewed at the following website address: http:www.ececs.uc.edu/∼mcahay/cathodes2.html.
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