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Volumn 29, Issue 8, 2000, Pages 500-507
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Surface characterization of poly(styrene-co-p-hexafluorohydroxyisopropyl-α-methyl styrene) copolymers by ToF-SIMS, XPS and contact angle measurements
a,b a a a a b |
Author keywords
[No Author keywords available]
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Indexed keywords
CONTACT ANGLE;
COPOLYMERS;
FLUORINE;
HALOGENATION;
INTERFACIAL ENERGY;
PLASTIC FILMS;
POLYSTYRENES;
SECONDARY ION MASS SPECTROMETRY;
X RAY PHOTOELECTRON SPECTROSCOPY;
ION MASS SPECTROMETRY;
POLYHEXAFLUOROHYDROXYISOPROPYL METHYL STYRENE;
SURFACE CHEMISTRY;
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EID: 0034250621
PISSN: 01422421
EISSN: None
Source Type: Journal
DOI: 10.1002/1096-9918(200008)29:8<500::AID-SIA893>3.0.CO;2-8 Document Type: Article |
Times cited : (16)
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References (27)
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