Dynamic SIMS characterization of interface structure of Ag/Alq3/NPB/ITO model devices

Surface and Interface Analysis

Volumn 32, Issue 1, 2001, Pages 102-105

  Yuan, Z Y ^a,c   Zhou, W ^a   Zhang, Z L ^a   Liu, J Q ^a   Wang, J Z ^a   Li, H X ^b   Peng, L M ^a  

^a INSTITUTE OF PHYSICS   (China)

^b UNIVERSITY OF ST ANDREWS   (United Kingdom)

^c NANKAI UNIVERSITY   (China)

Author keywords

Dynamic SIMS; Interface structure; OLEDs

Indexed keywords

ATOMIC FORCE MICROSCOPY; DEPOSITION; DIFFUSION IN SOLIDS; ELECTROLUMINESCENCE; INTERFACES (MATERIALS); MATHEMATICAL MODELS; MULTILAYERS; SECONDARY ION MASS SPECTROMETRY; VACUUM APPLICATIONS;

INTERFACE STRUCTURE; ORGANIC LIGHT-EMITTING DIODES (OLED);

LIGHT EMITTING DIODES;

EID: 0035420471     PISSN: 01422421     EISSN: None     Source Type: Journal    
DOI: 10.1002/sia.1016     Document Type: Conference Paper

References (17)