Effect of local stir and spatial averaging on measurement and testing in mode-tuned and mode-stirred reverberation chambers

IEEE Transactions on Electromagnetic Compatibility

Volumn 43, Issue 3, 2001, Pages 305-325

  Arnaut, Luk R ^a,b  

^a IEEE   (United Kingdom)

^b NATIONAL PHYSICAL LABORATORY   (United Kingdom)

Author keywords

Calibration; EMC testing; Emissions and susceptibility testing; EUT reliability; Measurement uncertainty; Mode stirred reverberation chamber; Random fields; Spectral analysis; Statistical characterization; Threshold crossings

Indexed keywords

MODE-STIRRED REVERBERATION CHAMBERS (MSRC);

ELECTROMAGNETIC WAVE EMISSION; MAGNETIC SUSCEPTIBILITY; REVERBERATION; TUNING;

ELECTROMAGNETIC FIELDS;

EID: 0035415767     PISSN: 00189375     EISSN: None     Source Type: Journal    
DOI: 10.1109/15.942603     Document Type: Article

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