Characterization of the maximum test level in a reverberation chamber

IEEE International Symposium on Electromagnetic Compatibility

Volumn , Issue , 1997, Pages 44-47

  Lehman, T H ^a   Freyer, G J ^a  

^a Science & Engineering Associates   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTROMAGNETIC WAVE POLARIZATION; ELECTRONIC EQUIPMENT TESTING; RANDOM PROCESSES; REVERBERATION; STATISTICAL TESTS;

CHI SQUARE DISTRIBUTION; ELECTROMAGNETIC ENVIRONMENTS (EME); REVERBERATION CHAMBERS;

ANECHOIC CHAMBERS;

EID: 0031366470     PISSN: 01901494     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (8)