Structure and electrical properties of SrBi2Ta2O9 thin films annealed in different atmosphere

Materials Letters

Volumn 49, Issue 5, 2001, Pages 303-307

  Ling, Huiqin ^a   Li, Aidong ^a   Wu, Di ^a   Yu, Tao ^a   Liu, Zhigou ^a   Ming, Naiben ^a  

^a NANJING UNIVERSITY   (China)

Author keywords

Ferroelectric; Layered; Metalorganic decomposition; N2 O2 atmospheres; SrBi2Ta2O9 thin film

Indexed keywords

ANNEALING; ARGON; DECOMPOSITION; FERROELECTRICITY; MORPHOLOGY; NITROGEN; OXYGEN; PLATINUM; SCANNING ELECTRON MICROSCOPY; SILICA; STRONTIUM COMPOUNDS; TITANIUM DIOXIDE; VACUUM APPLICATIONS; X RAY DIFFRACTION ANALYSIS;

METALORGANIC DECOMPOSITION; STRONTIUM BISMUTH TANTALATE;

FERROELECTRIC THIN FILMS;

EID: 0035398667     PISSN: 0167577X     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0167-577X(00)00389-X     Document Type: Article

References (13)