Reflectivity and photoluminescence studies in Bragg reflectors with absorbing layers

Semiconductor Science and Technology

Volumn 16, Issue 7, 2001, Pages 548-552

  Shen, J L ^a   Chang, C Y ^a   Liu, H C ^a   Chou, W C ^a   Chen, Y F ^b   Jung, T ^c   Wu, M C ^c  

^a CHUNG YUAN CHRISTIAN UNIVERSITY   (Taiwan)

^b NATIONAL TAIWAN UNIVERSITY   (Taiwan)

^c UNIVERSITY OF CALIFORNIA   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ANGLE MEASUREMENT; CAVITY RESONATORS; LIGHT ABSORPTION; PHOTOLUMINESCENCE; REFLECTION; REFRACTIVE INDEX; SEMICONDUCTING GALLIUM ARSENIDE; SEMICONDUCTOR QUANTUM WELLS; SPECTRUM ANALYSIS;

BRAGG REFLECTORS;

MIRRORS;

EID: 0035398407     PISSN: 02681242     EISSN: None     Source Type: Journal    
DOI: 10.1088/0268-1242/16/7/304     Document Type: Article

References (14)