Double shear speckle interlerometry for curvature measurement

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 2860, Issue , 1996, Pages 184-191

  Ganesan, A R ^a   Murukeshan, V M ^a   Meinlschmidt, P ^b   Sirohi, R S ^a  

^a INDIAN INSTITUTE OF TECHNOLOGY MADRAS   (India)

^b UNIVERSITY OF OLDENBURG   (Germany)

Author keywords

Curvature; Second order derivative; Shear Interferometry; Speckle

Indexed keywords

INTERFEROMETERS; LASER INTERFEROMETRY; SPECKLE;

CURVATURE; CURVATURE INFORMATION; CURVATURE MEASUREMENT; OBJECT DEFORMATION; OUT-OF-PLANE DISPLACEMENT; SECOND ORDER DERIVATIVES; SHEAR INTERFEROMETRY; SPECKLE INTERFEROMETER;

INFORMATION FILTERING;

EID: 0000656413     PISSN: 0277786X     EISSN: 1996756X     Source Type: Conference Proceeding    
DOI: 10.1117/12.276305     Document Type: Conference Paper

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