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Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms
Volumn 183, Issue 1-2, 2001, Pages 88-96
Layer-resolved depth profiling at single crystal surfaces
(4)
Busch, B W
a
Schulte, W H
a
Gustafsson, T
a
Uebing, C
b
a
RUTGERS UNIVERSITY
(
United States
)
b
MAX PLANCK INSTITUT FÜR EISENFORSCHUNG GMBH
(
Germany
)
Author keywords
[No Author keywords available]
Indexed keywords
CHROMIUM; CRYSTAL ORIENTATION; IRON; PARTICLE BEAM DYNAMICS; SEGREGATION (METALLOGRAPHY); SINGLE CRYSTALS;
LAYER-RESOLVED DEPTH PROFILING; MEDIUM ENERGY ION SCATTERING (MEIS);
ION BEAMS;
EID
:
0035397956
PISSN
:
0168583X
EISSN
:
None
Source Type
:
Journal
DOI
:
10.1016/S0168-583X(01)00572-9
Document Type
:
Article
Times cited : (
5
)
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