Intrinsic optical and structural properties of SrS thin films

Thin Solid Films

Volumn 350, Issue 1, 1999, Pages 67-71

  Poelman, D ^a   Wauters, D ^a   Van Meirhaeghe, R L ^a   Cardon, F ^a  

^a GHENT UNIVERSITY   (Belgium)

Author keywords

[No Author keywords available]

Indexed keywords

CRYSTAL ORIENTATION; ENERGY GAP; EVAPORATION; INFRARED SPECTROPHOTOMETERS; RAPID THERMAL ANNEALING; REFRACTIVE INDEX; SILICA; STRONTIUM COMPOUNDS; SUBSTRATES; THIN FILMS; ULTRAVIOLET SPECTROPHOTOMETERS; X RAY CRYSTALLOGRAPHY;

STRONTIUM SULFIDE;

SEMICONDUCTING FILMS;

EID: 0032686388     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0040-6090(99)00272-2     Document Type: Article

References (11)

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