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Volumn 11, Issue 4, 2001, Pages 409-415
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A Monte Carlo study of etching in the presence of a mask junction
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Author keywords
[No Author keywords available]
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Indexed keywords
ACTUATORS;
ANISOTROPY;
COMPUTER SIMULATION;
CONTACT ANGLE;
CRYSTAL ORIENTATION;
ETCHING;
FABRICATION;
INTERFACES (MATERIALS);
MASKS;
MONTE CARLO METHODS;
NUCLEATION;
SEMICONDUCTING SILICON;
SENSORS;
MASK JUNCTIONS;
WET CHEMICAL ETCHING;
SEMICONDUCTOR JUNCTIONS;
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EID: 0035395462
PISSN: 09601317
EISSN: None
Source Type: Journal
DOI: 10.1088/0960-1317/11/4/322 Document Type: Article |
Times cited : (9)
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References (12)
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