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Volumn 24, Issue 7, 2001, Pages 475-487

Transient reliability of ceramic structures

Author keywords

Failure; Fatigue; Reliability; Transient; Weibull

Indexed keywords

CRACK PROPAGATION; DYNAMIC LOADS; FAILURE ANALYSIS; FINITE ELEMENT METHOD; FRACTURE; STRESS CORROSION CRACKING; WEIBULL DISTRIBUTION;

EID: 0035389330     PISSN: 8756758X     EISSN: None     Source Type: Journal    
DOI: 10.1046/j.1460-2695.2001.00419.x     Document Type: Article
Times cited : (11)

References (19)
  • 2
    • 0021695291 scopus 로고
    • Regimes of creep and slow crack growth in high-temperature rupture of hot-pressed silicon nitride
    • Edited by R. E. Tressler and R. C. Bradt. Plenum Press, New York, USA
    • (1984) Deformatio, of Ceramic Materials II , pp. 573-586
    • Grathwohl, G.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.