Diffusion-time-resolved ion-beam-induced charge collection from stripe-like test junctions induced by heavy-ion microbeams

Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms

Volumn 181, Issue 1-4, 2001, Pages 315-319

  Guo, B N ^a   El Bouanani, M ^a   Renfrow, S N ^b   Nigam, M ^a   Walsh, D S ^b   Doyle, B L ^b   Duggan, J L ^a   McDaniel, F D ^a  

^a UNIVERSITY OF NORTH TEXAS   (United States)

^b SANDIA NATIONAL LABORATORIES   (United States)

Author keywords

Average arrival time; Diffusion time resolved ion beam induced charge collection; Diffusive charge collection; Heavy ion microprobe; Single even upset

Indexed keywords

CARBON; CARRIER CONCENTRATION; CHARGED PARTICLES; COMPUTER SIMULATION; DATA ACQUISITION; ION BEAMS; IONIC CONDUCTION; IONIZING RADIATION; RADIATION DETECTORS; SEMICONDUCTOR JUNCTIONS;

DIFFUSION TIME RESOLVED ION BEAM INDUCED CHARGE COLLECTION (DTRIBICC); MULTIPLE EVENT UPSETS (MEU); SINGLE EVENT UPSETS (SEU);

INTEGRATED CIRCUITS;

EID: 0035388183     PISSN: 0168583X     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0168-583X(01)00488-8     Document Type: Conference Paper

References (11)