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Zeitschrift fuer Metallkunde/Materials Research and Advanced Techniques

Volumn 92, Issue 7, 2001, Pages 707-711

Microstructure and modifications of Cu/Al2O3 interfaces

(6) Scheu, C a Stein, W a Klein, S a Wagner, T a Tomsia, A P a Ruhle M a

a MAX PLANCK INSTITUTE FOR INTELLIGENT SYSTEMS (Germany)

Author keywords

Cu Al2O3 interfaces; Microstructure; Transmission electron microscopy

Indexed keywords

ALUMINA; ANNEALING; CHEMICAL BONDS; COPPER; MICROSTRUCTURE; MOLECULAR BEAM EPITAXY; PARTIAL PRESSURE; TRANSMISSION ELECTRON MICROSCOPY;

IONIC-COVALENT BONDING; OXYGEN PARTIAL PRESSURES;

INTERFACES (MATERIALS);

EID: 0035386152 PISSN: 00443093 EISSN: None Source Type: Journal
DOI: None Document Type: Article

Times cited : (9)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.