Propagation of a magnetic domain wall in the presence of AFM fabricated defects

IEEE Transactions on Magnetics

Volumn 37, Issue 4 I, 2001, Pages 2331-2333

  Schumacher, H W ^a   Ravelosona, D ^a   Cayssol, F ^a   Wunderlich, J ^a   Chappert, C ^a   Mathet, V ^a   Thiaville, A ^b   Jamet, J P ^b   Ferre J ^b   Haug, R J ^c  

^a UNIVERSITÉ PARIS SACLAY   (France)

^b UNIVERSITÉ PARIS SUD   (France)

^c Leibniz University Hannover   (Germany)

Author keywords

AFM lithography; Domain wall pinning; Extraordinary hall effect; Magnetization reversal dynamics

Indexed keywords

HALL EFFECT; INDENTATION; LITHOGRAPHY; MAGNETIC DOMAINS; MAGNETIZATION; POINT DEFECTS;

ATOMIC FORCE MICROSCOPY (AFM) LITHOGRAPHY; DOMAIN WALL PINNING;

ULTRATHIN FILMS;

EID: 0035385945     PISSN: 00189464     EISSN: None     Source Type: Journal    
DOI: 10.1109/20.951163     Document Type: Article

References (14)