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Volumn 16, Issue 6, 2001, Pages 1626-1631

Phase separation in SiO2-TiO2 gel and glassy films studied by atomic force microscopy and transmission electron microscopy

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; HEAT TREATMENT; MICROSTRUCTURE; PHASE SEPARATION; PHOTOEMISSION; SILICA; SILICON WAFERS; SOLS; SPIN COATING; TITANIUM COMPOUNDS; TRANSMISSION ELECTRON MICROSCOPY;

EID: 0035382271     PISSN: 08842914     EISSN: None     Source Type: Journal    
DOI: 10.1557/JMR.2001.0225     Document Type: Article
Times cited : (3)

References (17)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.