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Volumn 16, Issue 6, 2001, Pages 1626-1631
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Phase separation in SiO2-TiO2 gel and glassy films studied by atomic force microscopy and transmission electron microscopy
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Author keywords
[No Author keywords available]
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Indexed keywords
ATOMIC FORCE MICROSCOPY;
HEAT TREATMENT;
MICROSTRUCTURE;
PHASE SEPARATION;
PHOTOEMISSION;
SILICA;
SILICON WAFERS;
SOLS;
SPIN COATING;
TITANIUM COMPOUNDS;
TRANSMISSION ELECTRON MICROSCOPY;
PURE SILICA FILMS;
TITANIA;
THIN FILMS;
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EID: 0035382271
PISSN: 08842914
EISSN: None
Source Type: Journal
DOI: 10.1557/JMR.2001.0225 Document Type: Article |
Times cited : (3)
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References (17)
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