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Volumn 217, Issue 2-3, 1997, Pages 155-161
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Structural study of SiO2-TiO2 sol-gel films by X-ray absorption and photoemission spectroscopies
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Author keywords
[No Author keywords available]
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Indexed keywords
ABSORPTION SPECTROSCOPY;
CHEMICAL BONDS;
COMPOSITION EFFECTS;
CONDENSATION REACTIONS;
FILM PREPARATION;
HEAT TREATMENT;
HIGH TEMPERATURE EFFECTS;
PHOTOEMISSION;
SILICA;
THIN FILMS;
TITANIUM DIOXIDE;
X RAY SPECTROSCOPY;
NEAR EDGE X RAY ABSORPTION FINE STRUCTURE (NEXAFS) SPECTROSCOPY;
SPIN COATING;
X RAY PHOTOEMISSION SPECTROSCOPY;
SOL-GELS;
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EID: 0031223972
PISSN: 00223093
EISSN: None
Source Type: Journal
DOI: 10.1016/S0022-3093(97)00155-5 Document Type: Article |
Times cited : (44)
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References (25)
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