SCOPUS 정보 검색 플랫폼

Thin Solid Films

Volumn 388, Issue 1-2, 2001, Pages 271-276

Effects of O, H and N passivation on photoluminescence from porous silicon

(6) Xiong, Z H a Liao, L S a Yuan, S a Yang, Z R a Ding, X M a Hou, X Y a

a FUDAN UNIVERSITY (China)

Author keywords

Auger electron spectroscopy; Infrared spectroscopy; Luminescence; Porous silicon

Indexed keywords

AMMONIUM COMPOUNDS; AUGER ELECTRON SPECTROSCOPY; CHEMICAL BONDS; ETCHING; ETHANOL; INFRARED SPECTROSCOPY; LASER BEAM EFFECTS; LIGHT ABSORPTION; NITRIDES; PASSIVATION; PHOTOLUMINESCENCE;

AMMONIUM SULFIDE;

POROUS SILICON;

EID: 0035372263 PISSN: 00406090 EISSN: None Source Type: Journal
DOI: 10.1016/S0040-6090(00)01887-3 Document Type: Article

Times cited : (29)

References (24)

1
- 0141775174
- (1990) Appl. Phys. Lett. , vol.57 , pp. 1046
- Canham, L.T.¹

2
- 0029959624
- (1996) Nature , vol.384 , pp. 338
- Hirschman, K.D.¹ Tsyhcskov, L.² Duttagupta, S.P.³ Fauchet, P.M.⁴

3
- 0001359747
- (1992) Appl. Phys. Lett. , vol.60 , pp. 639
- Tischler, M.A.¹ Collins, R.T.² Stathis, J.H.³ Tsang, J.C.⁴

4
- 0001525676
- (1992) Appl. Phys. Lett. , vol.61 , pp. 1649
- Collins, R.T.¹ Tischler, M.A.² Stathis, J.H.³

5
- 33748260414
- (1992) Appl. Phys. Lett. , vol.61 , pp. 943
- Petrova-Koch, V.¹ Muschik, T.² Kux, A.³ Meyer, B.K.⁴ Koch, F.⁵ Lehmann, V.⁶

6
- 0343127110
- (1996) J. Appl. Phys. , vol.80 , pp. 5967
- Li, G.B.¹ Hou, X.Y.² Yuan, S.³ Chen, H.J.⁴ Zhang, F.L.⁵ Fan, H.L.⁶ Wang, X.⁷

7
- 0027911730
- (1993) Appl. Phys. Lett. , vol.62 , pp. 1152
- Xiao, Y.¹ Heben, M.J.² McCullough, J.M.³ Tsuo, Y.S.⁴ Pankove, J.L.⁵ Deb, S.K.⁶

8
- 4243477040
- (1988) Phys. Rev. , vol.B37 , pp. 8234
- Gupta, P.¹ Colvin, V.L.² George, S.M.³

9
- 0019581272
- (1981) Solid State Commun. , vol.38 , pp. 1155
- Wagner, H.¹ Butz, R.² Backs, U.³ Burchmann, D.⁴

10
- 0026054244
- (1993) J. Eletrochem. Soc. , vol.138 , pp. 153
- Venkateswara Rao, A.¹ Ozanam, F.² Chazalviel, J.N.³

11
- 0001154975
- (1983) Phys. Rev. , vol.B28 , pp. 3234
- Lucovxky, G.¹ Yang, J.² Chao, S.S.³ Tyler, J.E.⁴ Czubatyi, W.⁵

12
- 0004327864
- McGraw-Hill Press, New York
- (1985) Instrumental Method of Chemistry Analysis, 5th edition , pp. 95
- Ewing, W.¹

13
- 24844469256
- (1983) Phys. Rev. , vol.B28 , pp. 3225
- Lucovsky, G.¹ Yang, J.² Chao, S.S.³ Tyler, J.E.⁴ Czubutyj, W.⁵

14
- 0001469080
- (1986) J. Vac. Sci. Technol. , vol.A4 , pp. 480
- Tsu, D.V.¹ Luccovsky, G.²

15
- 33645374893
- (1986) J. Vac. Sci. Technol. , vol.A4 , pp. 681
- Luccovsky, G.¹ Richard, P.D.² Tsu, D.V.³ Lin, S.Y.⁴ Markunas, R.J.⁵

16
- 0001382365
- (1989) Phys. Rev. , vol.B40 , pp. 1795
- Tsu, D.V.¹ Lucovsky, G.² Davidson, B.N.³

17
- 0005283228
- (1989) Phys. Rev. , vol.101 , pp. 1795
- Kaiser, W.¹ Keck, P.H.² Lange, C.F.³

18
- 0000252070
- (1993) Appl. Phys. Lett. , vol.63 , pp. 3306
- Shih, S.¹ Jung, K.H.² Yan, J.³ Kwong, D.L.⁴ Kovar, M.⁵ White, J.M.⁶ Geoge, T.⁷ Kim, S.⁸

19
- 0005326271
- (1989) Appl. Phys. Lett. , vol.54 , pp. 362
- Cowans, B.A.¹ Dardas, Z.² Carperter, M.S.³ Melloch, M.R.⁴

20
- 0000703152
- (1985) Phys. Rev. Lett. , vol.57 , pp. 249
- Yublonovitch, E.¹ Allare, D.L.² Chang, C.C.³ Gmitter, T.⁴ Bright, T.B.⁵

21
- 0001076141
- (1992) J. Appl. Phys. , vol.72 , pp. 3841
- Zheng, X.L.¹ Chen, H.C.² Wang, W.³

22
- 36449005188
- (1991) J. Appl. Phys. , vol.70 , pp. 442
- Canham, L.T.¹ Houlton, M.R.² Leong, W.Y.³ Pickering, C.⁴ Keen, J.M.⁵

23
- 0030110091
- (1996) Appl. Phys. Lett. , vol.68 , pp. 1663
- Cooke, D.W.¹ Bennett, B.L.² Farnum, E.H.³ Hults, W.L.⁴ Sickafus, K.E.⁵ Smith, J.F.⁶ Smith, J.L.⁷ Taylor, T.N.⁸ Tiwari, P.⁹

24
- 0030104013
- (1996) J. Appl. Phys. , vol.79 , pp. 3282
- Chen, H.J.¹ Hou, X.Y.² Li, G.B.³ Zhang, F.L.⁴ Yu, M.R.⁵ Wang, X.⁶

* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.