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Volumn 68, Issue 12, 1996, Pages 1663-1665
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SiOx luminescence from light-emitting porous silicon: Support for the quantum confinement/luminescence center model
a a a a a a a a b b |
Author keywords
[No Author keywords available]
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Indexed keywords
ANNEALING;
ELECTRON TUNNELING;
HYDROGEN;
MATHEMATICAL MODELS;
PHOTOLUMINESCENCE;
SCANNING ELECTRON MICROSCOPY;
SILICON COMPOUNDS;
SURFACES;
THERMAL EFFECTS;
X RAY PHOTOELECTRON SPECTROSCOPY;
ELECTRON HOLE RECOMBINATION;
FORWARD RECOIL SPECTROMETRY;
GAUSSIAN BANDS;
HYDROGEN LOSS;
LIGHT EMITTING POROUS SILICON;
LUMINESCENCE INTENSITY;
QUANTUM CONFINEMENT LUMINESCENCE CENTER MODEL;
SILICON OXIDES;
POROUS SILICON;
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EID: 0030110091
PISSN: 00036951
EISSN: None
Source Type: Journal
DOI: 10.1063/1.115898 Document Type: Article |
Times cited : (72)
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References (19)
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