Effect of temperature on structure and morphology of Bi4Ti3O12 thin films obtained from oxide precursors

Materials Letters

Volumn 49, Issue 2, 2001, Pages 108-111

  Araujo E B ^a   Nunes, V B ^b   Zanette, S I ^b   Eiras, J A ^a  

^a FEDERAL UNIVERSITY OF SÃO CARLOS   (Brazil)

^b CENTRO BRASILEIRO DE PESQUISAS FÍSICAS   (Brazil)

Author keywords

Bi4Ti3O12; Bismuth titanate; Chemical synthesis; Crystal growth; Microstructure; Morphology; Thin film

Indexed keywords

ATOMIC FORCE MICROSCOPY; BISMUTH COMPOUNDS; CRYSTAL GROWTH; CRYSTAL STRUCTURE; CRYSTALLIZATION; FERROELECTRIC THIN FILMS; FILM PREPARATION; MORPHOLOGY; OXIDES; SYNTHESIS (CHEMICAL); X RAY CRYSTALLOGRAPHY;

CRYSTALLIZATION TEMPERATURE;

FERROELECTRIC MATERIALS;

EID: 0035369330     PISSN: 0167577X     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0167-577X(00)00352-9     Document Type: Article

References (14)