Synthesis and characterization of thin films of Bi4Ti3O12 from oxide precursors

Journal of Physics D: Applied Physics

Volumn 32, Issue 9, 1999, Pages 957-960

  Araujo E B ^a   Eiras, J A ^a  

^a FEDERAL UNIVERSITY OF SÃO CARLOS   (Brazil)

Author keywords

[No Author keywords available]

Indexed keywords

BISMUTH COMPOUNDS; CAPACITANCE MEASUREMENT; CRYSTALLIZATION; FERROELECTRIC MATERIALS; FERROELECTRICITY; PERMITTIVITY; PLATINUM; SILICON WAFERS; SYNTHESIS (CHEMICAL); THERMAL EFFECTS; THIN FILMS; VOLTAGE MEASUREMENT;

FERROELECTRIC DOMAIN SWITCHING; OXIDE-PRECURSOR METHOD;

DIELECTRIC FILMS;

EID: 0343807169     PISSN: 00223727     EISSN: None     Source Type: Journal    
DOI: 10.1088/0022-3727/32/9/302     Document Type: Article

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