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Volumn 49, Issue 6 I, 2001, Pages 1107-1112

Optimum design of very high-efficiency microwave power amplifiers based on time-domain harmonic load-pull measurements

Author keywords

[No Author keywords available]

Indexed keywords

LOAD-PULL MEASUREMENTS;

EID: 0035368206     PISSN: 00189480     EISSN: None     Source Type: Journal    
DOI: 10.1109/22.925498     Document Type: Article
Times cited : (24)

References (9)
  • 1
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    • A. Mallet, D. Floriot, J. P. Viaud, F. Blache, J. M. Nebus, and S. Delage, "A 90% power added efficiency GaInp/GaAs HBT for L-band radar and mobile communication systems," IEEE Microwave Guided Wave Lett., vol. 6, pp. 132-134, Mar. 1996.
    • (1996) IEEE Microwave Guided Wave Lett. , vol.6 , pp. 132-134
    • Mallet, A.1    Floriot, D.2    Viaud, J.P.3    Blache, F.4    Nebus, J.M.5    Delage, S.6
  • 3
    • 0029209839 scopus 로고
    • Fully integrated nonlinear modeling and characterization system of microwave transistors with on-wafer pulsed measurements
    • Orlando, FL, May 15-19
    • J. P. Teyssier, J. P. Viaud, J. J. Raoux, and R. Query, "Fully integrated nonlinear modeling and characterization system of microwave transistors with on-wafer pulsed measurements," in IEEE MTT-S Int. Microwave Symp. Dig., Orlando, FL, May 15-19, 1995, pp. 1033-1036.
    • (1995) IEEE MTT-S Int. Microwave Symp. Dig. , pp. 1033-1036
    • Teyssier, J.P.1    Viaud, J.P.2    Raoux, J.J.3    Query, R.4
  • 5
    • 0000385574 scopus 로고
    • A theoretical analysis and experimental confirmation of the optimally loaded and overdriven RF power amplifier
    • Dec.
    • D. M. Snider, "A theoretical analysis and experimental confirmation of the optimally loaded and overdriven RF power amplifier," IEEE Trans. Electron Devices, vol. ED-14, pp. 851-857, Dec. 1967.
    • (1967) IEEE Trans. Electron Devices , vol.ED-14 , pp. 851-857
    • Snider, D.M.1
  • 6
    • 0032179126 scopus 로고    scopus 로고
    • Measurements of time domain voltage/current waveforms at RF and microwave frequencies, based on the use of a vector network analyzer, for the characterization of nonlinear devices: Application to high efficiency power amplifiers and frequency multipliers optimization
    • Oct.
    • D. Barataud, C. Arnaud, B. Thibaud, M. Campovecchio, J. M. Nebus, and J. P. Villotte, "Measurements of time domain voltage/current waveforms at RF and microwave frequencies, based on the use of a vector network analyzer, for the characterization of nonlinear devices: Application to high efficiency power amplifiers and frequency multipliers optimization," IEEE Trans. Instrum. Meas., vol. 47, pp. 1259-1264, Oct. 1998.
    • (1998) IEEE Trans. Instrum. Meas. , vol.47 , pp. 1259-1264
    • Barataud, D.1    Arnaud, C.2    Thibaud, B.3    Campovecchio, M.4    Nebus, J.M.5    Villotte, J.P.6
  • 7
    • 0027585391 scopus 로고
    • An improved calibration technique for on-wafer large signal transistor characterization
    • Apr.
    • A. Ferrero and U. Pisani, "An improved calibration technique for on-wafer large signal transistor characterization," IEEE Trans. Instrum. Meas., vol. 42, pp. 347-354, Apr. 1994.
    • (1994) IEEE Trans. Instrum. Meas. , vol.42 , pp. 347-354
    • Ferrero, A.1    Pisani, U.2
  • 8
    • 0029210706 scopus 로고
    • Accurate on-wafer measurement of phase and amplitude of the spectral components of incident and scattered voltage waves at the signal ports of a nonlinear microwave device
    • Orlando, FL, May
    • J. Verspecht, P. Debie, A. Barel, and L. Martens, "Accurate on-wafer measurement of phase and amplitude of the spectral components of incident and scattered voltage waves at the signal ports of a nonlinear microwave device," in IEEE MTT-S Int. Microwave Symp. Dig., Orlando, FL, May 1995, pp. 1029-1032.
    • (1995) IEEE MTT-S Int. Microwave Symp. Dig. , pp. 1029-1032
    • Verspecht, J.1    Debie, P.2    Barel, A.3    Martens, L.4
  • 9
    • 0028422178 scopus 로고
    • Individual characterization of broad-band sampling oscilloscope with a nose-to-nose calibration procedure
    • Apr.
    • J. Verspecht and K. Rush, "Individual characterization of broad-band sampling oscilloscope with a nose-to-nose calibration procedure," IEEE Trans. Instrum. Meas., vol. 43, pp. 347-354, Apr. 1993.
    • (1993) IEEE Trans. Instrum. Meas. , vol.43 , pp. 347-354
    • Verspecht, J.1    Rush, K.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.