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Surface and Interface Analysis

Volumn 31, Issue 6, 2001, Pages 480-483

Composition and structure of enriched alloy layers in filmed Al alloys studied by medium-energy ion scattering

(7) Bailey, P a Skeldon, P b Noakes, T C Q a Thompson, G E b Sakairi, M b Habazaki, H c Shimizu, K d

a DARESBURY LABORATORY (United Kingdom)

b UNIVERSITY OF MANCHESTER (United Kingdom)

c HOKKAIDO UNIVERSITY (Japan)

d KEIO UNIVERSITY (Japan)

Author keywords

Alloys; Aluminium; Copper; Depth profiling; MEIS

Indexed keywords

ALUMINUM ALLOYS; COMPOSITION EFFECTS; CRYSTAL ORIENTATION; ELECTROLYTIC POLISHING;

MEDIUM-ENERGY ION SCATTERING;

COPPER ALLOYS;

EID: 0035363004 PISSN: 01422421 EISSN: None Source Type: Journal
DOI: 10.1002/sia.1098 Document Type: Article

Times cited : (19)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.