SCOPUS 정보 검색 플랫폼 - 논문 보기

메뉴 건너뛰기

Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers

Volumn 40, Issue 6 A, 2001, Pages 3960-3964

Dependence of fractal formation on thickness ratio and annealing time in Au/Ge bilayer films

(6) Chen, Zhiwen a Tan, Shun a Zhang, Shuyuan a Hou, Jianguo a Wu, Ziqin a Sekine, Hisashi b

a UNIVERSITY OF SCIENCE AND TECHNOLOGY OF CHINA (China)

b TEIKYO UNIVERSITY (Japan)

Author keywords

Annealing time; Au a Ge bilayer films; Fractal formation; Thickness ratio

Indexed keywords

ANNEALING; CRYSTALLIZATION; FRACTALS; NUCLEATION; POLYCRYSTALLINE MATERIALS; TRANSMISSION ELECTRON MICROSCOPY;

ANNEALING TIME; BILAYER FILMS; FRACTAL FORMATION; THICKNESS RATIO;

SEMICONDUCTING FILMS;

EID: 0035358903 PISSN: 00214922 EISSN: None Source Type: Journal
DOI: 10.1143/jjap.40.3960 Document Type: Article

Times cited : (6)

References (18)

1
- 11944271811
- (1989) Phys. Rev. Lett. , vol.74 , pp. 4694
- Bardotti, L.¹ Jensen, P.² Hoareau, A.³ Treilleux, M.⁴ Cabaud, B.⁵

2
- 0000246518
- (1990) Rep. Prog. Phys. , vol.53 , pp. 917
- Gomer, H.¹

3
- 0042319450
- ed. E. Kaldis (North-Holland, Amsterdam)
- (1981) Current Topics in Materials Science , vol.7
- Stoyanov, S.¹ Kaschiev, D.²

4
- 0001098515
- (1994) Phys. Rev. B , vol.50 , pp. 6057
- Bales, G.S.¹ Charzan, D.C.²

5
- 44949273391
- (1991) Nucl. Instrum. Methods Phys. Res. B , vol.35 , pp. 544
- Yamada, I.¹

6
- 0000003817
- (1995) J. Appl. Phys. , vol.77 , pp. 587
- Ba, L.¹ Zen, J.L.² Zhang, S.Y.³ Wu, Z.Q.⁴

7
- 84969017952
- (1969) Jpn. J. Appl. Phys. , vol.8 , pp. 1056
- Oki, F.¹ Ogawa, Y.² Fujika, Y.³

8
- 11644313473
- (1989) Phys. Rev. B , vol.40 , pp. 1008
- Hou, J.G.¹ Wu, Z.Q.²

9
- 33744645036
- (1990) Phys. Rev. B , vol.42 , pp. 3271
- Hou, J.G.¹ Wu, Z.Q.²

10
- 0000018988
- (1998) J. Vac. Sci. Technol. A , vol.16 , pp. 2292
- Chen, Z.W.¹ Zhang, S.Y.² Tan, S.³ Hou, J.G.⁴ Zhang, Y.H.⁵

11
- 18744414598
- (1990) Phys. Rev. B , vol.41 , pp. 11591
- Bi, L.S.¹ Wu, Z.Q.²

12
- 0032496490
- (1998) Thin Solid Films , vol.322 , pp. 194
- Chen, Z.W.¹ Zhang, S.Y.² Tan, S.³ Tian, M.L.⁴ Hou, J.G.⁵ Zhang, Y.H.⁶

13
- 0000555242
- (1986) Acta Phys. Sin. , vol.35 , pp. 365
- Zhang, R.J.¹ Wu, Z.Q.²

14
- 84913078506
- (1989) Thin Solid Films , vol.172 , pp. 77
- Hou, J.G.¹ Wu, Z.Q.²

15
- 35949005734
- (1993) Phys. Rev. B , vol.47 , pp. 3638
- Li, B.Q.¹ Zheng, B.² Zhang, S.Y.³ Wu, Z.Q.⁴

16
- 0000581133
- (1999) Phys. Rev. B , vol.60 , pp. 5904
- Zhang, S.Y.¹ Wang, X.P.² Chen, Z.W.³ Wu, Z.Q.⁴ Jin-Phillipp, N.Y.⁵ Kelsch, M.⁶ Phillipp, F.⁷

17
- 0003586464
- (Plenum, New York)
- (1988) Fractal , pp. 15
- Feder, J.¹

18
- 0000022749
- (1969) J. Appl. Phys. , vol.40 , pp. 4214
- Chen, H.S.¹ Turnbull, D.²

* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.