SCOPUS 정보 검색 플랫폼

Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers

Volumn 40, Issue 6 A, 2001, Pages 3996-4001

Electron-beam focusing and deflection properties for misaligned dual gate field emitters

(3) Nicolaescu, Dan a Filip, Valeriu b Itoh, Junji a

a NATIONAL INSTITUTE OF ADVANCED INDUSTRIAL SCIENCE AND TECHNOLOGY AIST (Japan)

b UNIVERSITY OF BUCHAREST (Romania)

Author keywords

Electron beam focusing and deflection; Field emission; Misaligned dual gate emitter; Vacuum microelectronics

Indexed keywords

COMPUTER SIMULATION; COMPUTER SOFTWARE; ELECTRODES; ELECTRON BEAMS; ELECTRON GUNS; FIELD EMISSION DISPLAYS; MICROELECTRONICS; SEMICONDUCTOR DEVICE MANUFACTURE; SEMICONDUCTOR DEVICE STRUCTURES;

DEFLECTION PROPERTIES; DUAL GATE FIELD EMITTERS; ELECTRON BEAM FOCUSING; ELECTRON TRAJECTORIES; EMITTER STRUCTURE MISALIGNMENTS; VACUUM MICROELECTRONICS;

GATES (TRANSISTOR);

EID: 0035358659 PISSN: 00214922 EISSN: None Source Type: Journal
DOI: 10.1143/jjap.40.3996 Document Type: Article

Times cited : (4)

References (23)

1
- 0017245762
- (1976) J. Appl. Phys. , vol.47 , pp. 5248
- Spindt, C.A.¹ Brodie, I.² Humphrey, L.³ Westerberg, E.R.⁴

2
- 0005264543
- (1995) J. Vac. Sci. & Technol. B , vol.13 , pp. 1968
- Itoh, J.¹ Tohma, Y.² Morikawa, K.³ Kanemaru, S.⁴ Shimizu, K.⁵

3
- 0028507425
- (1994) J. Micromech. Microeng. , vol.4 , pp. 106
- Busta, H.H.¹ Poggemiller, J.E.² Zimmerman, B.J.³

4
- 0029273181
- (1995) J. Vac. Sci. & Technol. B , vol.13 , pp. 571
- Tang, C.-M.¹ Swyden, T.A.² Ting, A.C.³

5
- 0029249748
- (1995) IEEE Trans. Electron Devices , vol.42 , pp. 340
- Kesling, D.W.¹ Hunt, Ch.E.²

6
- 0000365129
- (1996) Jpn. J. Appl. Phys. , vol.35 , pp. 6626
- Yamaoka, Y.¹ Kanemaru, S.² Itoh, J.³

7
- 0000344224
- (1996) J. Vac. Sci. & Technol. B , vol.14 , pp. 1902
- Toma, Y.¹ Kanemaru, S.² Itoh, J.³

8
- 0001155339
- (1996) J. Vac. Sci. & Technol. B , vol.14 , pp. 3455
- Tang, C.-M.¹ Swyden, T.A.² Thomason, K.A.³ Yadon, L.N.⁴ Temple, D.⁵ Ball, C.A.⁶ Palmer, W.D.⁷ Mancusi, J.E.⁸ Vellenga, D.⁹ McGuire, G.E.¹⁰

9
- 0031103558
- (1997) IEEE Trans. Electron Devices , vol.44 , pp. 498
- Py, C.¹ Itoh, J.² Hirano, T.³ Kanemaru, S.⁴

10
- 22644450269
- (1999) J. Vac. Sci. & Technol. B , vol.17 , pp. 575
- Hosono, A.¹ Kawabuchi, S.² Horibata, S.³ Okuda, S.⁴ Harada, H.⁵ Takai, M.⁶

11
- 0034155739
- (2000) J. Vac. Sci. & Technol. A , vol.18 , pp. 626
- Py, C.¹ Gao, M.² Das, S.R.³ Grant, P.⁴ Marshall, P.⁵ LeBrun, L.⁶

12
- 0034155455
- (2000) J. Vac. Sci. & Technol. B , vol.18 , pp. 679
- Py, C.¹

13
- 0034155841
- (2000) J. Vac. Sci. & Technol. B , vol.18 , pp. 911
- Lan, Y.C.¹ Lai, J.T.² Chen, S.H.³ Wang, W.C.⁴ Tsai, C.H.⁵ Tsai, K.L.⁶ Sheu, C.Y.⁷

14
- 0034155769
- (2000) J. Vac. Sci. & Technol. B , vol.18 , pp. 923
- Lee, N.S.¹ Lee, H.W.² Kim, Jl.³ Jung, S.Y.⁴ Choi, J.H.⁵ Park, Y.J.⁶ Kim, J.W.⁷ Jung, J.E.⁸ Park, N.S.⁹ Park, S.H.¹⁰ Jin, Y.W.¹¹ Choi, W.B.¹² Kim, J.M.¹³ Chee, J.K.¹⁴

15
- 0026238699
- (1991) IEEE Trans. Electron Devices , vol.38 , pp. 2392
- Asano, T.¹

16
- 11744333904
- (1998) J. Vac. Sci. & Technol. B , vol.16 , pp. 654
- Garcia, N.¹ Marques, M.I.² Asenjo, A.³ Correia, A.⁴

17
- 0027644101
- (1993) IEEE Trans. Electron Devices , vol.40 , pp. 1537
- Busta, H.H.¹

18
- 0035060856
- (2001) Jpn. J. Appl. Phys. , vol.40 , pp. 83
- Nicolaescu, D.¹ Filip, V.² Itoh, J.³

19
- 0003791158
- Idaho National Engineering and Environmental Laboratory, Idaho Falls, ID 83415
- (2000) Simion 3D Version 7.0 User's Manual INEEL-95/0403
- Dahl, D.A.¹

20
- 0029277572
- (1995) J. Vac. Sci. & Technol. B , vol.13 , pp. 531
- Nicolaescu, D.¹

21
- 0004380463
- (2001) J. Vac. Sci. & Technol. B , vol.19
- Nicolaescu, D.¹ Filip, V.² Itoh, J.³

22
- 0032776996
- (1999) Mater. Sci. & Eng. R , vol.24 , pp. 185
- Temple, D.¹

23
- 22644448463
- (1999) J. Vac. Sci. & Technol. B , vol.17 , pp. 588
- Koga, K.¹ Kanemaru, S.² Matsukawa, T.³ Itoh, J.⁴

* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.