Charge states of divacancies in self-implanted doped Si

Journal of Applied Physics

Volumn 89, Issue 11 I, 2001, Pages 5991-5996

  Szpala, S ^a   Simpson, P J ^a  

^a UNIVERSITY OF WESTERN ONTARIO   (Canada)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0035356167     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1363682     Document Type: Article

References (31)

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