Derivation of the shear compliance of thin films on quartz resonators from comparison of the frequency shifts on different harmonics: A perturbation analysis

Journal of Applied Physics

Volumn 89, Issue 11 I, 2001, Pages 6356-6364

  Johannsmann, Diethelm ^a  

^a MAX PLANCK INSTITUTE FOR POLYMER RESEARCH   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0035356110     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1358317     Document Type: Article

References (23)

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