SCOPUS 정보 검색 플랫폼

Volumn 28, Issue 5, 2001, Pages 455-458

Laser diode interferometer used to measure displacements in large range with a nanometer accuracy

Author keywords

Interferometer; Laser diode; Nanometer measurement; Optical measurement; Photothermal modulation

Indexed keywords

DISTANCE MEASUREMENT; INTERFEROMETERS;

LARGE-RANGE DISPLACEMENT MEASUREMENT; LASER DIODE INTERFEROMETER; NANOMETER-PRECISION DISPLACEMENT MEASUREMENT;

SEMICONDUCTOR LASERS;

EID: 0035351529 PISSN: 02587025 EISSN: None Source Type: Journal
DOI: None Document Type: Article

Times cited : (11)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.