Photothermal modulation of laser diode wavelength: application to sinusoidal phase-modulating interferometer for displacement measurements

Optics and Laser Technology

Volumn 31, Issue 8, 1999, Pages 559-564

  Wang, Xuefeng ^a   Wang, Xiangzhao ^a   Qian, Feng ^a   Chen, Gang ^a   Chen, Gaoting ^a   Fang, Zujie ^a  

^a SHANGHAI INSTITUTE OF OPTICS AND FINE MECHANICS   (China)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER SIMULATION; FOURIER TRANSFORMS; INTERFEROMETERS; MEASUREMENT ERRORS; OPTICAL TESTING; OPTICAL VARIABLES MEASUREMENT; PHASE MODULATION; PIEZOELECTRIC TRANSDUCERS; SIGNAL INTERFERENCE;

DISPLACEMENT MEASUREMENTS; INTENSITY MODULATION; LASER DIODE WAVELENGTH; PHOTOTHERMAL EFFECT; PHOTOTHERMAL MODULATION; SINUSOIDAL PHASE MODULATING INTERFEROMETER; WAVELENGTH MODULATION;

SEMICONDUCTOR LASERS;

EID: 0033345541     PISSN: 00303992     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0030-3992(99)00114-0     Document Type: Article

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