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Volumn 174, Issue 4, 2001, Pages 433-438

Algorithm for statistical noise reduction in three-dimensional ion implant simulations

Author keywords

Computer simulation; Ion implantation; Rare event

Indexed keywords

ALGORITHMS; COMPUTER SIMULATION; MONTE CARLO METHODS; SEMICONDUCTING SILICON; SEMICONDUCTOR DOPING; SPURIOUS SIGNAL NOISE;

EID: 0035342005     PISSN: 0168583X     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0168-583X(00)00627-3     Document Type: Article
Times cited : (4)

References (17)
  • 1
    • 0005241418 scopus 로고    scopus 로고
    • International Technology Roadmap for Semiconductors. Semiconductor Industry Association
    • (1997)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.