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Volumn 174, Issue 4, 2001, Pages 433-438
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Algorithm for statistical noise reduction in three-dimensional ion implant simulations
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Author keywords
Computer simulation; Ion implantation; Rare event
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Indexed keywords
ALGORITHMS;
COMPUTER SIMULATION;
MONTE CARLO METHODS;
SEMICONDUCTING SILICON;
SEMICONDUCTOR DOPING;
SPURIOUS SIGNAL NOISE;
STATISTICAL NOISE REDUCTION;
ION IMPLANTATION;
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EID: 0035342005
PISSN: 0168583X
EISSN: None
Source Type: Journal
DOI: 10.1016/S0168-583X(00)00627-3 Document Type: Article |
Times cited : (4)
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References (17)
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