An ESPI system for determining in-plane deformations. Three-dimensional analysis of the carrier fringes and a proposal for analysis of transient in-plane deformations

Measurement Science and Technology

Volumn 12, Issue 5, 2001, Pages 644-651

  Hurtado Ramos, Juan B ^a,b   Blanco Garcia J ^a   Fernandez A ^a   Ribas, F ^a  

^a UNIVERSITY OF VIGO   (Spain)

^b CENTRO DE INVESTIGACIONES EN ÓPTICA   (Mexico)

Author keywords

Deformation measurements; Electronic speckle pattern interferometer; In plane deformation

Indexed keywords

LASERS; LIGHTING; TRANSIENTS;

CARRIER FRINGES;

DEFORMATION;

CAMERA; DEFORMATION; INTERFEROMETRY; MEASUREMENT METHOD;

EID: 0035337738     PISSN: 09570233     EISSN: None     Source Type: Journal    
DOI: 10.1088/0957-0233/12/5/312     Document Type: Article

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