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Volumn 32, Issue 5-6, 2001, Pages 397-408
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High-power robust semiconductor electronics technologies in the new millennium
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Author keywords
Modeling; Power electronics; Power semiconductor devices; Power semiconductor materials; Reliability; Silicon; Wide energy band gap materials
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Indexed keywords
COMPUTER SIMULATION;
CRYSTAL DEFECTS;
CRYSTAL IMPURITIES;
ELECTRIC NETWORK TOPOLOGY;
ENERGY GAP;
POWER CONVERTERS;
RESIDUAL STRESSES;
SEMICONDUCTOR DEVICE MANUFACTURE;
SEMICONDUCTOR DEVICE MODELS;
SWITCHING CIRCUITS;
WIDE ENERGY BAND GAP MATERIALS;
POWER ELECTRONICS;
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EID: 0035333517
PISSN: 00262692
EISSN: None
Source Type: Journal
DOI: 10.1016/S0026-2692(01)00010-6 Document Type: Article |
Times cited : (19)
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References (31)
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