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Volumn 32, Issue 5-6, 2001, Pages 397-408

High-power robust semiconductor electronics technologies in the new millennium

Author keywords

Modeling; Power electronics; Power semiconductor devices; Power semiconductor materials; Reliability; Silicon; Wide energy band gap materials

Indexed keywords

COMPUTER SIMULATION; CRYSTAL DEFECTS; CRYSTAL IMPURITIES; ELECTRIC NETWORK TOPOLOGY; ENERGY GAP; POWER CONVERTERS; RESIDUAL STRESSES; SEMICONDUCTOR DEVICE MANUFACTURE; SEMICONDUCTOR DEVICE MODELS; SWITCHING CIRCUITS;

EID: 0035333517     PISSN: 00262692     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0026-2692(01)00010-6     Document Type: Article
Times cited : (19)

References (31)
  • 1
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    • Advances in power electronics - Its impact on the environment
    • ISIE'98 , pp. 28-30
    • Bose, B.K.1
  • 6
    • 0004905764 scopus 로고    scopus 로고
    • Key power semiconductor milestones set the stage for future power electronic systems
    • Dec.
    • (1998) PCIM Magazine , pp. 10-21
    • Lorenz, L.1
  • 8
    • 0032256942 scopus 로고    scopus 로고
    • A new generation of high-voltage MOSFETs breaks the limit line of silicon
    • IEDM'98 , pp. 683-685
    • Deboy, G.1
  • 13
    • 0027891679 scopus 로고    scopus 로고
    • A 4500 V injection enhanced insulated gate bipolar transistor (IEGT) operating in a mode similar to a thyristor
    • IEDM'93 , pp. 679-682
    • Kitagawa, M.1
  • 15
    • 0029718334 scopus 로고    scopus 로고
    • 4 kV insulated gate controlled thyristor with low on-state voltage drop
    • ISPSD'96 , pp. 253-256
    • Sakano, J.1
  • 19
    • 0033100172 scopus 로고    scopus 로고
    • Study of bulk and elementary screw dislocation assisted reverse breakdown in low voltage (250 V) 4H-SiC p+n junction diodes - Part I DC properties
    • (1999) IEEE Trans. Electron Devices , vol.46 , Issue.3 , pp. 478-484
    • Neudeck, P.1    Huang, W.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.