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Volumn 29, Issue 5, 2001, Pages 367-377
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A study for the cartography of the interface roughness of V-shaped AlGaAs/GaAs quantum wires
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Author keywords
Interface roughness; Photoluminescence; V shaped quantum wires
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Indexed keywords
COMPOSITION EFFECTS;
EXCITONS;
INTERFACES (MATERIALS);
MATHEMATICAL MODELS;
PHOTOLUMINESCENCE;
SEMICONDUCTING ALUMINUM COMPOUNDS;
SEMICONDUCTING GALLIUM ARSENIDE;
STRUCTURE (COMPOSITION);
SURFACE ROUGHNESS;
ALUMINUM GALLIUM ARSENIDE;
FULL WIDTH AT HALF MAXIMUM;
INTERFACE ROUGHNESS;
MICROPHOTOLUMINESCENCE SPECTRA;
SEMICONDUCTOR QUANTUM WIRES;
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EID: 0035333101
PISSN: 07496036
EISSN: None
Source Type: Journal
DOI: 10.1006/spmi.2001.0979 Document Type: Article |
Times cited : (8)
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References (29)
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