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Volumn 35, Issue 4, 2001, Pages 347-350+369

Analysis of charge accumulation at dielectric interface

Author keywords

Charge accumulation; Insulator; Surface charge

Indexed keywords

DIELECTRIC MATERIALS; INTERFACES (MATERIALS); MATHEMATICAL MODELS;

EID: 0035314394     PISSN: 0253987X     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article
Times cited : (17)

References (10)
  • 1
    • 0006618717 scopus 로고    scopus 로고
    • Chinese source
  • 3
    • 0021654942 scopus 로고
    • On the electrostatic field near the charged surface of an insulator with special reference to surface charge probe measurements
    • Christophorou L.G. and Pace M.O. (ed.), NY: Pergamon Press
    • (1984) Gaseous Dielectrics IV , pp. 414-421
    • Pedersen, A.1
  • 4
    • 0006590162 scopus 로고    scopus 로고
    • Chinese source
  • 8
    • 0029386278 scopus 로고
    • Surface charge accumulation: An inevitable phenomenon in DC GIS
    • (1995) IEEE Trans. on DEI , vol.2 , Issue.5 , pp. 771-778
    • Jing, T.1
  • 9
    • 0003791664 scopus 로고
    • 6
    • The Netherlands: Delft University
    • (1993)
    • Jing, T.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.