-
3
-
-
33646896571
-
Micro hardness measurement with the aid of calibrated scanning force microscopes
-
Tampere (Finland), 1-6 June 1997
-
K. Hasche, K. Herrmann, F. Pohlenz, K. Thiele, Micro hardness measurement with the aid of calibrated scanning force microscopes, in: Proc. XIV IMEKO World Congress, Tampere (Finland), 1-6 June 1997, Vol. III, 1997, pp. 240-245.
-
(1997)
Proc. XIV IMEKO World Congress
, vol.3
, pp. 240-245
-
-
Hasche, K.1
Herrmann, K.2
Pohlenz, F.3
Thiele, K.4
-
4
-
-
0031254975
-
Untersuchungen zu Kalibrierverfahren für Universalhärte-Meßgeräte
-
H.-H. Behncke, K. Herrmann, W. Würzner, Untersuchungen zu Kalibrierverfahren für Universalhärte-Meßgeräte, PTB-Mitteilungen 107 (5) (1997) 325-332.
-
(1997)
PTB-Mitteilungen
, vol.107
, Issue.5
, pp. 325-332
-
-
Behncke, H.-H.1
Herrmann, K.2
Würzner, W.3
-
5
-
-
1542519719
-
Calibrated scanning force microscopes - A new approach
-
H. Kunzmann et al. (Ed.), Braunschweig, 26-30 May 1997
-
M. Bienias, S. Gao, K. Hasche, R. Seemann, K. Thiele, Calibrated scanning force microscopes - a new approach, in: H. Kunzmann et al. (Ed.), Proc. 9-IPES/UME4, Braunschweig, 26-30 May 1997, 1997, pp. 101-104.
-
(1997)
Proc. 9-IPES/UME4
, pp. 101-104
-
-
Bienias, M.1
Gao, S.2
Hasche, K.3
Seemann, R.4
Thiele, K.5
-
6
-
-
0038383321
-
Development of scanning force microscopy with subnanometric capability
-
Semmering (Austria), 12-14 January PTB-F-39, Braunschweig
-
K. Hasche, Herrmann, W. Mirandé, F. Pohlenz, Seemann, Development of scanning force microscopy with subnanometric capability. Proc. 4th Seminar on Quantitative Microscopy 2000, Semmering (Austria), 12-14 January 2000, PTB-F-39, Braunschweig, pp. 219-225.
-
(2000)
Proc. 4th Seminar on Quantitative Microscopy 2000
, pp. 219-225
-
-
Hasche, K.1
Herrmann2
Mirandé, W.3
Pohlenz, F.4
Seemann5
-
7
-
-
0042802393
-
Laser-based measurement to nanometer scale accuracy
-
Florianopolis, Brazil, October
-
G. Jäger, Laser-based measurement to nanometer scale accuracy, in: Proc. Laser Metrology 1999, Florianopolis, Brazil, October 1999, pp. 5.38-5.47.
-
(1999)
Proc. Laser Metrology 1999
, pp. 538-547
-
-
Jäger, G.1
-
8
-
-
0010558079
-
Determination of the geometry of microhardness indenters using a calibrated scanning force microscope
-
5-6 November Lyngby (Denmark), PTB-F-34, Braunschweig, December 1998
-
K. Thiele, K. Hasche, K. Hermann, R. Seemann, Determination of the geometry of microhardness indenters using a calibrated scanning force microscope, in: Proc. of the 3rd Seminar on Quantitative Microscopy, 5-6 November 1998, Lyngby (Denmark), PTB-F-34, Braunschweig, December 1998, pp. 115-122.
-
(1998)
Proc. of the 3rd Seminar on Quantitative Microscopy
, pp. 115-122
-
-
Thiele, K.1
Hasche, K.2
Hermann, K.3
Seemann, R.4
-
9
-
-
0032114462
-
Determination of the geometry of microhardness indenters with a scanning force microscope
-
K. Hasche, K. Herrmann, F. Pohlenz, K. Thiele, Determination of the geometry of microhardness indenters with a scanning force microscope, Meas. Sci. Technol. 9 (1998) 1082-1086.
-
(1998)
Meas. Sci. Technol.
, vol.9
, pp. 1082-1086
-
-
Hasche, K.1
Herrmann, K.2
Pohlenz, F.3
Thiele, K.4
-
10
-
-
0024705225
-
Auswirkung einer Spitzenverrundung des Prüfdiamanten auf die Mikrohärte unter Prüfkraft
-
D. Dengel, Auswirkung einer Spitzenverrundung des Prüfdiamanten auf die Mikrohärte unter Prüfkraft, Materialprüfung 31 (1989) 227-229.
-
(1989)
Materialprüfung
, vol.31
, pp. 227-229
-
-
Dengel, D.1
-
11
-
-
0000380783
-
Anforderungen an Eindringkörper für die Universalhärte
-
W. Weiler, H.-H. Behncke, Anforderungen an Eindringkörper für die Universalhärte, Materialprüfung 32 (1990) 301-303.
-
(1990)
Materialprüfung
, vol.32
, pp. 301-303
-
-
Weiler, W.1
Behncke, H.-H.2
-
12
-
-
0024020330
-
Auswirkungen einer Dachkante auf die Mikrohärte nach Vickers und Knoop
-
D. Dengel, Auswirkungen einer Dachkante auf die Mikrohärte nach Vickers und Knoop, Materialprüfung 30 (1988) 184-186.
-
(1988)
Materialprüfung
, vol.30
, pp. 184-186
-
-
Dengel, D.1
-
13
-
-
33646882016
-
Progress in determination of the area function of indenters used for nanoindentation
-
San Diego (USA), 10-14, April in print
-
K. Herrmann, N.M. Jennett, W. Wegener, J. Meneve, K. Hasche, R. Seemann, Progress in determination of the area function of indenters used for nanoindentation. Proc. International Conference on Metallic Coatings and Thin Films, San Diego (USA), 10-14, April 2000 (in print).
-
(2000)
Proc. International Conference on Metallic Coatings and Thin Films
-
-
Herrmann, K.1
Jennett, N.M.2
Wegener, W.3
Meneve, J.4
Hasche, K.5
Seemann, R.6
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