Studies of impurities in magnetic semiconductors: An example of important XAFS applications

Journal of Synchrotron Radiation

Volumn 8, Issue 2, 2001, Pages 874-876

  Soo, Y L ^a   Kioseoglou, G ^a   Huang, S ^a   Kim, S ^a   Kao, Y H ^a   Takatani, Y ^b   Haneda, S ^b   Munekata, H ^b  

^a UNIVERSITY AT BUFFALO   (United States)

^b TOKYO INSTITUTE OF TECHNOLOGY   (Japan)

Author keywords

Diluted Magnetic Semiconductors; EXAFS; NEXAFS

Indexed keywords

ARTICLE;

EID: 0035288982     PISSN: 09090495     EISSN: None     Source Type: Journal    
DOI: 10.1107/S0909049500016708     Document Type: Article

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