General model for consecutive-k-out-of-n: F repairable system with exponential distribution and (k-1)-step Markov dependence

European Journal of Operational Research

Volumn 129, Issue 3, 2001, Pages 663-682

  Lam, Yeh ^a   Ng, Hon Keung Tony ^b  

^a SUN YAT SEN UNIVERSITY   (China)

^b MCMASTER UNIVERSITY   (Canada)

Author keywords

[No Author keywords available]

Indexed keywords

FAILURE ANALYSIS; MARKOV PROCESSES; MATHEMATICAL MODELS; PREVENTIVE MAINTENANCE; RISK MANAGEMENT;

EXPONENTIAL DISTRIBUTIONS; TRANSITION DENSITY MATRIX;

OPERATIONS RESEARCH;

EID: 0035284189     PISSN: 03772217     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0377-2217(99)00474-9     Document Type: Article

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