Repairable consecutive-k-out-of-n: F system with Markov dependence

Naval Research Logistics

Volumn 47, Issue 1, 2000, Pages 18-39

  Lam, Yeh ^a   Zhang, Yuan Lin ^b  

^a CHINESE UNIVERSITY OF HONG KONG   (Hong Kong)

^b SOUTHEAST UNIVERSITY   (China)

Author keywords

[No Author keywords available]

Indexed keywords

FAILURE ANALYSIS; MARKOV PROCESSES; MATHEMATICAL MODELS; MATRIX ALGEBRA; RELIABILITY; RISK MANAGEMENT;

FAILURE RISK; MARKOV DEPENDENCE; TRANSITION DENSITY MATRIX;

LOGISTICS;

EID: 0033891466     PISSN: 0894069X     EISSN: None     Source Type: Journal    
DOI: 10.1002/(SICI)1520-6750(200002)47:1<18::AID-NAV2>3.0.CO;2-B     Document Type: Article

References (17)

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