Reduction of sampling and analytical errors for electron microscopic analysis of atmospheric aerosols

Atmospheric Environment

Volumn 30, Issue 24, 1996, Pages 4137-4148

  Huang, Po Fu ^a   Turpin, Barbara ^a,b  

^a University of Minnesota   (United States)

^b Rutgers University   (United States)

Author keywords

Atmospheric aerosol; Beam damage; Electron microscopy; Single particle analysis

Indexed keywords

AMMONIUM SULFATE; BERYLLIUM; CARBON; SILICON; SULFURIC ACID;

AEROSOL; AIR POLLUTION; AIR SAMPLING; ANALYTICAL ERROR; ARTICLE; ATMOSPHERE; CALIBRATION; DISPERSION; ELECTRON BEAM; ELECTRON MICROSCOPY; PRIORITY JOURNAL;

AEROSOL; ATMOSPHERIC PARTICLE; ELECTRON MICROSCOPY; ENERGY DISPERSIVE SPECTROSCOPY; METHOD EVALUATION; PARTICLE ANALYSIS; SAMPLING;

ELECTRON MICROSCOPY; PARTICLES (PARTICULATE MATTER); RADIATION DAMAGE; SAMPLING; SPECTROSCOPY;

ATMOSPHERIC PARTICLES; ENERGY DISPERSIVE SPECTROSCOPY; SINGLE PARTICLE ANALYSIS;

ATMOSPHERIC AEROSOLS;

EID: 0030306996     PISSN: 13522310     EISSN: None     Source Type: Journal    
DOI: 10.1016/1352-2310(96)00150-1     Document Type: Article

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