Inelastic X-ray scattering as a novel tool to study electronic excitations in complex insulators

Journal of Electron Spectroscopy and Related Phenomena

Volumn 114-116, Issue , 2001, Pages 705-709

  Hasan, M Z ^a   Isaacs, E D ^b   Shen, Z X ^a   Miller, L L ^c  

^a STANFORD UNIVERSITY   (United States)

^b LUCENT TECHNOLOGIES   (United States)

^c IOWA STATE UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

COPPER COMPOUNDS; ELECTRON ENERGY LEVELS; OXIDE SUPERCONDUCTORS; X RAY SCATTERING;

MOTT INSULATORS;

ELECTRIC INSULATING MATERIALS;

EID: 0035278634     PISSN: 03682048     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0368-2048(00)00401-1     Document Type: Article

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