Trap levels in RF sputtered CdS thin films

Physica Status Solidi (A) Applied Research

Volumn 184, Issue 1, 2001, Pages 175-178

  Ashour, H ^a   Akkad, F E L ^a  

^a KUWAIT UNIVERSITY   (Kuwait)

Author keywords

[No Author keywords available]

Indexed keywords

CADMIUM SULFIDE; COPPER; CRYSTAL DEFECTS; CRYSTAL IMPURITIES; ELECTRON TRAPS; FILM PREPARATION; MAGNETRON SPUTTERING; SEMICONDUCTING CADMIUM COMPOUNDS; SILVER; SPECTROSCOPIC ANALYSIS; THIN FILMS;

PHOTOINDUCED CURRENT TRANSIENT SPECTROSCOPY (PICTS);

SEMICONDUCTING FILMS;

EID: 0035275825     PISSN: 00318965     EISSN: None     Source Type: Journal    
DOI: 10.1002/1521-396X(200103)184:1<175::AID-PSSA175>3.0.CO;2-M     Document Type: Article

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