XPS, Raman spectroscopy, X-ray diffraction, specular X-ray reflectivity, transmission electron microscopy and elastic recoil detection analysis of emissive carbon film characterization

Surface and Interface Analysis

Volumn 31, Issue 3, 2001, Pages 185-190

  Ermolieff, A ^a   Chabli, A ^a   Pierre, F ^a   Rolland, G ^a   Rouchon, D ^a   Vannuffel, C ^a   Vergnaud, C ^a   Baylet, J ^a   Semeria M N ^a  

^a CEA LETI   (France)

Author keywords

Emissive carbon films; ERDA; Raman spectroscopy; TEM; X ray; XPS

Indexed keywords

CRYSTAL STRUCTURE; ELASTICITY; ELECTRONIC PROPERTIES; LASER ABLATION; PLASMA ENHANCED CHEMICAL VAPOR DEPOSITION; PULSED LASER APPLICATIONS; RAMAN SPECTROSCOPY; SURFACE STRUCTURE; THIN FILMS; TRANSMISSION ELECTRON MICROSCOPY; X RAY DIFFRACTION ANALYSIS; X RAY PHOTOELECTRON SPECTROSCOPY;

CARBON FILM EMISSIVITY; ELASTIC RECOIL DETECTION ANALYSIS; EMISSIVE CARBON FILM; PULSED LASER ABLATION; SPECULAR X-RAY REFLECTIVITY; SURFACE ANALYSIS;

CARBON;

EID: 0035274107     PISSN: 01422421     EISSN: None     Source Type: Journal    
DOI: 10.1002/sia.955     Document Type: Article

References (15)

1. Determining hybridation differences for amorphous carbon from the XPS C1s envelope