Fabrication and characterization of SNS Josephson junctions with an aluminum barrier

IEEE Transactions on Applied Superconductivity

Volumn 11, Issue 1 I, 2001, Pages 1130-1133

  Lacquaniti, V ^a   Maggi, S ^a   Polcari, A ^a   Steni, R ^a   Andreone, D ^a  

^a ISTITUTO ELETTROTECNICO NAZIONALE GALILEO FERRARIS   (Italy)

Author keywords

Cryogenic electronics; Josephson junctions; Superconducting devices; Thin film devices

Indexed keywords

ATOMIC FORCE MICROSCOPY; CRITICAL CURRENT DENSITY (SUPERCONDUCTIVITY); ELECTRIC PROPERTIES; MAGNETIC FIELD MEASUREMENT; THIN FILM DEVICES; VOLTAGE REGULATORS;

CRYOGENIC ELECTRONICS; SEMICONDUCTOR NORMAL METAL SUPERCONDUCTOR; SHAPIRO LIKE RADIO FREQUENCY;

JOSEPHSON JUNCTION DEVICES;

EID: 0035269197     PISSN: 10518223     EISSN: None     Source Type: Journal    
DOI: 10.1109/77.919547     Document Type: Conference Paper

References (11)

1. Quasipotential and the stability of phase lock in nonhysteretic Josephson junctions
2. Superconductor-normal-superconductor junctions for the programmable voltage standards
3. Stack Josephson with sidewall shunt
4. 10 V SINIS Josephson junctions series arrays for programmable voltage standards
5. RSFQ-based D/A converter for ac voltage standard
6. Josephson voltage standards
7. Nb-based SNS junctions with Al and TaOx barriers for a programmable Josephson voltage standard
8. High-resistivity superconductor-normal-superconductor junctions for an ac Josephson voltage standard
9. Theory of the current-voltage characteristics of SNS junctions and other superconductiong weak-links
10. Development of a Nb/Al technology for SNS Josephson junctions
11. Magnetic field behavior of SNS edge Josephson junctions