High-resistivity superconductor-normal-superconductor junctions for an AC Josephson voltage standard

Philosophical Magazine B: Physics of Condensed Matter; Statistical Mechanics, Electronic, Optical and Magnetic Properties

Volumn 80, Issue 5, 2000, Pages 965-971

  Lacquaniti, V ^a   Maggi, S ^a   Monticone, E ^a   Polcari, A ^a   Steni, R ^a   Andreone, D ^a  

^a ISTITUTO ELETTROTECNICO NAZIONALE GALILEO FERRARIS   (Italy)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0034191616     PISSN: 13642812     EISSN: None     Source Type: Journal    
DOI: 10.1080/01418630008221963     Document Type: Article

References (12)

1. BENZ, S. P., 1996, Appl. Phys. Lett., 76, 2714.
2. BENZ, S. P., and HAMILTON, C. A., 1996, Appl. Phys. Lett., 68, 3171.
3. CHANG, C. Y., and VOOK, R. W., 1991, J. vac. Sci. Technol. A, 9, 559.
4. DARULA, M., KOHLSTEDT, H., AMATUNI, L., and KLUSHIN, A. M., 1997, Proceedings of the Third European Conference on Applied Superconductivity, p. 599.
5. HAMILTON, C. A., BURROUGHS, C. J., and BENZ, S. P., 1997, IEEE Trans. appl. Supercond., 7, 3756.
6. HAMILTON, C. A., BURROUGHS, C. J., and KAUTZ, R. L., 1995, IEEE Trans. Instrum. Measurements, 44, 223.
7. IMAMURA, T., and HASUO, S., 1989, J. appl. Phys., 66, 2173.
8. KAUTZ, R. L., 1995, J. appl. Phys., 78, 5811.
9. PAMBIANCHI, M. S., LI, W., COUGHLIN, J., TALEJ, E., and BROCK, D. K., 1999, IEEE Trans. appl. Supercond., 9, 4154.
10. SACHSE H., PÖPEL, R., WEIMANN, T., MULLER, F., HEIAN, G., and NIEMEYER, J., 1997, Proceedings of the Third European Conference on Applied Superconductivity, p. 555. (Bristol and Philadelphia: Institute of Physics Publishing).
11. SCHULZE, H., BEHR, R., MULLER, F., and NIEMEYER, J., 1998, Appl. Phys. Lett., 73, 996.
12. VOSSEN, I. L., and KERN, W. (editors), 1978, Thin Film Processes, (New York: Academic Press).