Spread of critical currents in thin-film YBa2Cu3O7-x bicrystal junctions

IEEE Transactions on Applied Superconductivity

Volumn 11, Issue 1 I, 2001, Pages 414-417

  Shadrin, Pavel ^a,b   Divin, Yuri ^a  

^a Juelich Research Center   (Germany)

^b INSTITUTE OF RADIO ENGINEERING AND ELECTRONICS   (Russian Federation)

Author keywords

Grain boundary; Josephson junctions; Laser scanning microscopy; Local probing

Indexed keywords

CRITICAL CURRENT DENSITY (SUPERCONDUCTIVITY); ELECTRIC CURRENT MEASUREMENT; GRAIN BOUNDARIES; JOSEPHSON JUNCTION DEVICES; LASER BEAMS; MICROSCOPIC EXAMINATION; PROBES; SUPERCONDUCTING FILMS; YTTRIUM BARIUM COPPER OXIDES;

BICRYSTAL JUNCTIONS; LASER INDUCED VOLTAGE RESPONSE; LASER SCANNING MICROSCOPY;

HIGH TEMPERATURE SUPERCONDUCTORS;

EID: 0035268072     PISSN: 10518223     EISSN: None     Source Type: Journal    
DOI: 10.1109/77.919371     Document Type: Conference Paper

References (4)

1. Microstructure of an artificial grain boundary weak link in an YBCO thin film
2. Spatially resolved analysis of high-Tc grain boundary Josephson junctions and arrays
3. Submicrometer electrical imaging of grain boundaries in high-Tc thin-film junctions by laser scanning microscopy