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Volumn 524, Issue 1-3, 2003, Pages 199-205
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Isothermal adsorption and desorption studies of In/Si(1 1 1) by reflection high energy electron diffraction and fluorescent X-ray spectroscopy
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Author keywords
Indium; Low index single crystal surfaces; Reflection high energy electron diffraction (RHEED); Silicon; Thermal desorption; X ray emission
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Indexed keywords
ADSORPTION;
DESORPTION;
FLUORESCENCE;
ISOTHERMS;
REFLECTION HIGH ENERGY ELECTRON DIFFRACTION;
SILICON;
SINGLE CRYSTALS;
X RAYS;
LOW INDEX SINGLE CRYSTAL SURFACES;
SURFACE PHENOMENA;
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EID: 0035263151
PISSN: 00396028
EISSN: None
Source Type: Journal
DOI: 10.1016/S0039-6028(02)02544-X Document Type: Article |
Times cited : (8)
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References (27)
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