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Volumn 524, Issue 1-3, 2003, Pages 199-205

Isothermal adsorption and desorption studies of In/Si(1 1 1) by reflection high energy electron diffraction and fluorescent X-ray spectroscopy

Author keywords

Indium; Low index single crystal surfaces; Reflection high energy electron diffraction (RHEED); Silicon; Thermal desorption; X ray emission

Indexed keywords

ADSORPTION; DESORPTION; FLUORESCENCE; ISOTHERMS; REFLECTION HIGH ENERGY ELECTRON DIFFRACTION; SILICON; SINGLE CRYSTALS; X RAYS;

EID: 0035263151     PISSN: 00396028     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0039-6028(02)02544-X     Document Type: Article
Times cited : (8)

References (27)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.